Sandoz, Patrick A.: шукати на сайті Z-Library

Журнал:

Mauze, Benjamin, Dahmouche, Redwan, Laurent, Guillaume J., Andre, Antoine N., Rougeot, Patrick, Sandoz, Patrick, Clevy, Cedric

Рік:

1996

Мова:

english

Файл:

PDF, 528 KB

english, 1996

Nanometer Precision with a Planar Parallel Continuum Robot

Журнал:

IEEE Robotics and Automation Letters

Рік:

2020

Мова:

english

Файл:

PDF, 1.18 MB

english, 2020

Phase-shifting methods for interferometers using laser-diode frequency-modulation

Patrick Sandoz, Tijani Gharbi, Gilbert Tribillon

Журнал:

Optics Communications

Рік:

1996

Мова:

english

Файл:

PDF, 380 KB

english, 1996

Wavelet transform as a processing tool in white-light interferometry

Sandoz, Patrick, Devillers, Robert, Plata, Arturo

Журнал:

Optics Letters

Рік:

1997

Мова:

english

Файл:

PDF, 256 KB

english, 1997

Unambiguous profilometry by fringe-order identification in white-light phase-shifting interferometry

Журнал:

Рік:

1997

Мова:

english

Файл:

PDF, 835 KB

english, 1997

Sampling of two-dimensional images: prevention from spectrum overlap and ghost detection

Sandoz, Patrick, Tribillon, Gilbert

Журнал:

Optical Engineering

Рік:

2004

Мова:

english

Файл:

PDF, 1.43 MB

english, 2004

Profilometry by Zero-order Interference Fringe Identification

Журнал:

Sandoz, Patrick, Tribillon, Gilbert, Perrin, Hervé

Рік:

1993

Мова:

english

Файл:

PDF, 196 KB

english, 1993

High-resolution profilometry by using phase calculation algorithms for spectroscopic analysis of white-light interferograms

Журнал:

Sandoz, Patrick, Jacquot, Maxime, Gorecki, Christophe

Рік:

1996

Мова:

english

Файл:

PDF, 662 KB

english, 1996

SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Optical Inspection and Micromeasurements II - Processing of white-light correlograms: simultaneous phase and envelope measurements by wavelet transformation

Рік:

1997

Мова:

english

Файл:

PDF, 326 KB

english, 1997

[IEEE 2016 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) - Daejeon, South Korea (2016.10.9-2016.10.14)] 2016 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS) - Single frequency-based visual servoing for microrobotics applications

Guelpa, Valerian, Laurent, Guillaume J., Tamadazte, Brahim, Sandoz, Patrick, Le Fort-Piat, Nadine, Clevy, Cedric

Рік:

2016

Мова:

english

Файл:

PDF, 3.66 MB

english, 2016

High resolution digital holography

Maxime Jacquot, Patrick Sandoz, Gilbert Tribillon

Журнал:

Optics Communications

Рік:

2001

Мова:

english

Файл:

PDF, 374 KB

english, 2001

Multi-aperture optical head for parallel scanning near field optical microscopy

Patrick Sandoz, Remo Giust, Gilbert Tribillon

Журнал:

Optics Communications

Рік:

1999

Мова:

english

Файл:

PDF, 756 KB

english, 1999

Roughness measurement by confocal microscopy for brightness characterization and surface waviness visibility evaluation

Patrick Sandoz, Gilbert Tribillon, Tijani Gharbi, Robert Devillers

Журнал:

Wear

Рік:

1996

Мова:

english

Файл:

PDF, 784 KB

english, 1996

Towards objective evaluation of the skin aspect: principles and instrumentation

Patrick Sandoz, David Marsaut, Vincent Armbruster, Philippe Humbert, Tijani Gharbi

Журнал:

Skin Research and Technology

Рік:

2004

Мова:

english

Файл:

PDF, 767 KB

english, 2004

Activation of JNK1 contributes to dystrophic muscle pathogenesis

Steven M. Kolodziejczyk, Gregory S. Walsh, Kim Balazsi, Patrick Seale, Jackie Sandoz, Andrée M. Hierlihy, Michael A. Rudnicki, Jeffrey S. Chamberlain, Freda D. Miller, Lynn A. Megeney

Журнал:

Current Biology

Рік:

2001

Мова:

english

Файл:

PDF, 397 KB

english, 2001

Surface profiling by means of double spectral modulation

Calatroni, José E., Sandoz, Patrick, Tribillon, Gilbert

Журнал:

Sandoz, Patrick, Bonnans, Vincent, Gharbi, Tijani

Рік:

1993

Мова:

english

Файл:

PDF, 1.16 MB

english, 1993

High-Accuracy Position and Orientation Measurement of Extended Two-Dimensional Surfaces by a Phase-Sensitive Vision Method

Журнал:

Рік:

2002

Мова:

english

Файл:

PDF, 813 KB

english, 2002

Nanometric position and displacement measurement of the six degrees of freedom by means of a patterned surface element

Журнал:

Grosjean, Thierry, Saleh, Said Sadat, Suarez, Miguel Angel, Ibrahim, Idriss Abdoulkader, Piquerey, Vincent, Charraut, Daniel, Sandoz, Patrick

Рік:

2005

Мова:

english

Файл:

PDF, 703 KB

english, 2005

Fiber microaxicons fabricated by a polishing technique for the generation of Bessel-like beams

Журнал:

Galeano Z., July A., Sandoz, Patrick, Gaiffe, Emilie, Launay, Sophie, Robert, Laurent, Jacquot, Maxime, Hirchaud, Fabienne, Prétet, Jean-Luc, Mougin, Christiane

Рік:

2007

Мова:

english

Файл:

PDF, 729 KB

english, 2007

Position-referenced microscopy for live cell culture monitoring

Журнал:

Biomedical Optics Express

Рік:

2011

Мова:

english

Файл:

PDF, 1.69 MB

english, 2011

Lensless vision system for in-plane positioning of a patterned plate with subpixel resolution

Sandoz, Patrick, Jacquot, Maxime

Журнал:

Journal of the Optical Society of America A

Рік:

2011

Мова:

english

Файл:

PDF, 929 KB

english, 2011

3D localization of a labeled target by means of a stereo vision configuration with subvoxel resolution

Arias H., Néstor A., Sandoz, Patrick, Meneses, Jaime E., Suarez, Miguel A., Gharbi, Tijani

Журнал:

Optics Express

Рік:

2010

Мова:

english

Файл:

PDF, 1.44 MB

english, 2010

Does AIDS involve some collusion by the neuro-immune system because of positive learning of the disarmament strategy?

Sandoz, Patrick A., Chung, Aram J., Weaver, Westbrook M., Di Carlo, Dino

Журнал:

Medical Hypotheses

Рік:

2013

Мова:

english

Файл:

PDF, 181 KB

english, 2013

Sugar Additives Improve Signal Fidelity for Implementing Two-Phase Resorufin-Based Enzyme Immunoassays

Журнал:

Langmuir

Рік:

2014

Мова:

english

Файл:

PDF, 873 KB

english, 2014

[IEEE 2009 International Symposium on Optomechatronic Technologies (ISOT 2009) - Istanbul, Turkey (2009.09.21-2009.09.23)] 2009 International Symposium on Optomechatronic Technologies - Space-frequency analysis of pseudo-periodic patterns for subpixel position control

Sandoz, Patrick, Galeano Zea, July A.

Рік:

2009

Мова:

english

Файл:

PDF, 960 KB

english, 2009

[IEEE 2009 International Symposium on Optomechatronic Technologies (ISOT 2009) - Istanbul, Turkey (2009.09.21-2009.09.23)] 2009 International Symposium on Optomechatronic Technologies - Position encryption of extended surfaces for subpixel localization of small-sized fields of observation

Galeano Zea, July A., Sandoz, Patrick, Robert, Laurent

Рік:

2009

Мова:

english

Файл:

PDF, 3.36 MB

english, 2009

[IEEE 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Paris, France (2012.10.29-2012.10.31)] 2012 International Symposium on Optomechatronic Technologies (ISOT 2012) - Twin-scale vernier micro-pattern for visual measurement of 1D in-plane absolute displacements with increased range-to-resolution ratio

Zea, July Galeano, Sandoz, Patrick, Laurent, Guillaume, Lemos, Lucas Lopes, Clevy, Cedric

Рік:

2012

Мова:

english

Файл:

PDF, 3.20 MB

english, 2012

Pseudo-Periodic Encryption of Extended 2-D Surfaces for High Accurate Recovery of any Random Zone by Vision

Galeano-Zea, July-Andrea, Sandoz, Patrick, Gaiffe, Emilie, Pretet, Jean-Luc, Mougin, Christiane

Журнал:

International Journal of Optomechatronics

Рік:

2010

Мова:

english

Файл:

PDF, 1.97 MB

english, 2010

In-plane rigid-body vibration mode characterization with a nanometer resolution by stroboscopic imaging of a microstructured pattern

Sandoz, Patrick, Friedt, Jean-Michel, Carry, Emile

Журнал:

Review of Scientific Instruments

Рік:

2007

Мова:

english

Файл:

PDF, 1.11 MB

english, 2007

[IEEE 2014 IEEE International Conference on Robotics and Automation (ICRA) - Hong Kong, China (2014.5.31-2014.6.7)] 2014 IEEE International Conference on Robotics and Automation (ICRA) - Characterization and compensation of XY micropositioning robots using vision and pseudo-periodic encoded patterns

Tan, Ning, Clevy, Cedric, Laurent, Guillaume J., Sandoz, Patrick, Chaillet, Nicolas

Рік:

2014

Мова:

english

Файл:

PDF, 1.59 MB

english, 2014

Twin-scale Vernier Micro-pattern for Visual Measurement of 1-D in-plane Absolute Displacements with Increased Range-to-Resolution Ratio

Zea, July Galeano, Sandoz, Patrick, Laurent, Guillaume J., Lemos, Lucas Lopes, Clevy, Cédric

Журнал:

International Journal of Optomechatronics

Рік:

2013

Мова:

english

Файл:

PDF, 842 KB

english, 2013

Inertial microfluidic programming of microparticle-laden flows for solution transfer around cells and particles

Sollier, Elodie, Amini, Hamed, Go, Derek E., Sandoz, Patrick A., Owsley, Keegan, Di Carlo, Dino

Журнал:

Microfluidics and Nanofluidics

Рік:

2015

Мова:

english

Файл:

PDF, 2.62 MB

english, 2015

Live-cell multiplane three-dimensional super-resolution optical fluctuation imaging

Geissbuehler, Stefan, Sharipov, Azat, Godinat, Aurélien, Bocchio, Noelia L., Sandoz, Patrick A., Huss, Anja, Jensen, Nickels A., Jakobs, Stefan, Enderlein, Jörg, Gisou van der Goot, F., Dubikovskaya,

Журнал:

Nature Communications

Рік:

2014

Мова:

english

Файл:

PDF, 2.56 MB

english, 2014

Subpixelic Measurement of Large 1D Displacements: Principle, Processing Algorithms, Performances and Software

Guelpa, Valérian, Laurent, Guillaume, Sandoz, Patrick, Zea, July, Clévy, Cédric

Журнал:

Sensors

Рік:

2014

Мова:

english

Файл:

PDF, 6.34 MB

english, 2014

Potential of a wavelength sampling approach for profilometry by phase shifting interferometry

Sandoz, Patrick, Calatroni, Jose, Tribillon, Gilbert

Журнал:

Guelpa, Valerian, Laurent, Guillaume J., Sandoz, Patrick, Clevy, Cedric

Рік:

1999

Мова:

english

Файл:

PDF, 428 KB

english, 1999

Vision-Based Microforce Measurement With a Large Range-to-Resolution Ratio Using a Twin-Scale Pattern

Журнал:

IEEE/ASME Transactions on Mechatronics

Рік:

2015

Мова:

english

Файл:

PDF, 868 KB

english, 2015

Toward stereovisual monitoring of three-dimensional translations with submicrometer resolution

Sandoz, Patrick, Elhechmi, Imen, Gharbi, Tijani

Журнал:

Journal of the Optical Society of America A

Рік:

2012

Мова:

english

Файл:

PDF, 1.52 MB

english, 2012

SPIE Proceedings [SPIE European Conferences on Biomedical Optics - Munich, Germany (Sunday 14 June 2009)] Advanced Microscopy Techniques - Position-referenced microscopy: regions of interest localization and subpixel image comparison by means of pseudo-random patterns embedded in cell culture boxes

Galeano Zea, July A., Sandoz, Patrick, Robert, Laurent, Gaiffe, Emilie, Prétet, Jean-Luc, Mougin, Christiane, Campagnola, Paul J., Stelzer, Ernst H. K., von Bally, Gert

Рік:

2009

Мова:

english

Файл:

PDF, 3.39 MB

english, 2009

Accuracy Quantification and Improvement of Serial Micropositioning Robots for In-Plane Motions

Tan, Ning, Clevy, Cedric, Laurent, Guillaume J., Sandoz, Patrick, Chaillet, Nicolas

Журнал:

IEEE Transactions on Robotics

Рік:

2015

Мова:

english

Файл:

PDF, 1.23 MB

english, 2015

SPIE Proceedings [SPIE 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications - Cartagena de Indias, Colombia (Monday 28 September 1998)] 3rd Iberoamerican Optics Meeting and 6th Latin American Meeting on Optics, Lasers, and Their Applications - White light interferometry: innovative algorithms and performances

Sandoz, Patrick, Calatroni, Jose E., Tribillon, Gilbert M., Guzman, Angela M.

Рік:

1999

Мова:

english

Файл:

PDF, 1.37 MB

english, 1999

SPIE Proceedings [SPIE Intelligent Systems and Advanced Manufacturing - Boston, MA (Sunday 28 October 2001)] Microrobotics and Microassembly III - Development of a microrobot-based micropositioning station: the microrobot and its position and orientation measurement method

Dembele, Sounkalo, Rochdi, Karima, Sandoz, Patrick, Lemoal, Patrice, Nelson, Bradley J., Breguet, Jean-Marc

Рік:

2001

Мова:

english

Файл:

PDF, 381 KB

english, 2001

SPIE Proceedings [SPIE SPIE Europe Optical Metrology - Munich, Germany (Monday 15 June 2009)] Optical Measurement Systems for Industrial Inspection VI - Pseudo-periodic patterns for subpixel accuracy visual control: principle, pattern designs, and performances

Galeano Zea, July A., Lehmann, Peter H., Sandoz, Patrick

Рік:

2009

Мова:

english

Файл:

PDF, 627 KB

english, 2009

Potential of a wavelength sampling approach for profilometry by phase shifting interferometry

Sandoz, Patrick, Calatroni, Jose, Tribillon, Gilbert

Журнал: